Abstract

A three-wavelength method based on Cauchy or Sellmeier formulas is proposed for simultaneous determination of the thickness and refractive index without using approximate expansions of the refraction index over the wavelength. The method is also applicable for the simultaneous determination of other optical characteristics together with the refractive index. To test the applicability of the proposed method, the refractive index and thickness of ultrathin polysulfone film were obtained in the surface plasmon resonance experiment.

中文翻译：

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以超薄聚砜薄膜表面等离子共振研究为例，利用柯西或塞尔迈尔公式同时测定厚度和折射率

摘要

提出了一种基于 Cauchy 或 Sellmeier 公式的三波长方法，用于同时确定厚度和折射率，而不使用折射率在波长上的近似扩展。该方法也适用于与折射率一起同时测定其他光学特性。为了测试所提出方法的适用性，在表面等离子体共振实验中获得了超薄聚砜薄膜的折射率和厚度。