This contribution reports on the effects of 450 keV proton irradiation within the 10¹⁵–10¹⁷H⁺/cm² fluence range on nano-crystalline Ni thin films. The surface and in-volume induced damages were investigated by grazing incidence X-rays diffraction, atomic force microscopy, Rutherford backscattering as well as four-point probe resistivity measurements. Within such a type of H⁺ irradiation, a significant surface roughening and amorphization of the external parts of the Ni crystallites for the lowest fluence (10¹⁵ H⁺/cm² and a re-crystalization for higher fluences (10¹⁶–10¹⁷ H⁺/cm²) was observed.

中文翻译：

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450 keV质子下纳米晶镍的辐射硬度

该贡献报告了 10 ¹⁵ –10 ¹⁷ H ⁺ /cm ²能量密度范围内的 450 keV 质子辐照对纳米晶 Ni 薄膜的影响。通过掠入射 X 射线衍射、原子力显微镜、卢瑟福背散射以及四点探针电阻率测量来研究表面和体积内引起的损伤。在这种类型的 H ⁺辐射中，对于最低注量（10 ¹⁵  H ⁺ /cm ²和更高注量（10 ¹⁶ –10 ¹⁷  H⁺ /cm ² ) 被观察到。