The electric double layer (EDL) effect at solid electrolyte/electrode interfaces has been a key topic in many energy and nanoelectronics applications (e.g., all-solid-state Li⁺ batteries and memristors). However, its characterization remains difficult in comparison with liquid electrolytes. Herein, we use a novel method to show that the EDL effect, and its suppression at solid electrolyte/electronic material interfaces, can be characterized on the basis of the electric conduction characteristics of hydrogenated diamond(H-diamond)-based EDL transistors (EDLTs). Whereas H-diamond-based EDLT with a Li-Si-Zr-O Li⁺ solid electrolyte showed EDL-induced hole density modulation over a range of up to three orders of magnitude, EDLT with a Li-La-Ti-O (LLTO) Li⁺ solid electrolyte showed negligible enhancement, which indicates strong suppression of the EDL effect. Such suppression is attributed to charge neutralization in the LLTO, which is due to variation in the valence state of the Ti ions present. The method described is useful for quantitatively evaluating the EDL effect in various solid electrolytes.

固体电解质/电极界面的双电层 (EDL) 效应一直是许多能源和纳米电子学应用（例如，全固态 Li ⁺电池和忆阻器）中的关键主题。然而，与液体电解质相比，其表征仍然困难。在此，我们使用一种新方法表明，基于氢化金刚石（H-金刚石）的 EDL 晶体管（EDLT）的导电特性可以表征 EDL 效应及其在固体电解质/电子材料界面处的抑制). 而基于氢金刚石的 EDLT 与 Li-Si-Zr-O Li ⁺固体电解质显示 EDL 诱导的空穴密度调制范围高达三个数量级，EDLT 与 Li-La-Ti-O (LLTO )李⁺固体电解质显示出可忽略不计的增强，这表明对 EDL 效应的强烈抑制。这种抑制归因于 LLTO 中的电荷中和，这是由于存在的 Ti 离子的价态变化所致。所描述的方法可用于定量评估各种固体电解质中的 EDL 效应。