Molecular Desorption by a Moving Contact Line,Physical Review Letters

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Molecular Desorption by a Moving Contact Line
Physical Review Letters ( IF 8.1 ) Pub Date : 2021-08-05 , DOI: 10.1103/physrevlett.127.065501
Sylvain Franiatte ₁ , Philippe Tordjeman ₁ , Thierry Ondarçuhu ₁

Affiliation

The interaction of the contact line with topographical or chemical defects at the nanometer scale sets the macroscopic wetting properties of a liquid on a solid substrate. Based on specific atomic force microscopy (AFM) experiments, we demonstrate that molecules physically sorbed on a surface are removed by a dynamic contact line. The mechanism of molecules desorption is directly determined by the capillary force exerted at the contact line on the molecules. We also emphasize the potential of AFM to clearly decorrelate the effects of topographical and chemical defects and monitor, with a subsecond time resolution, the dynamics of molecules adsorption on a surface.

中文翻译：

移动接触线的分子解吸

接触线与纳米尺度的地形或化学缺陷的相互作用设定了液体在固体基材上的宏观润湿特性。基于特定的原子力显微镜 (AFM) 实验，我们证明物理吸附在表面上的分子被动态接触线去除。分子解吸的机制直接由作用在分子接触线上的毛细管力决定。我们还强调了 AFM 的潜力，可以清楚地消除地形和化学缺陷的影响，并以亚秒级的时间分辨率监测表面上分子吸附的动力学。

更新日期：2021-08-05

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