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Angle calibration and error analysis of wide-angle X-ray scattering (WAXS) with a one-dimensional linear detector
Instrumentation Science & Technology ( IF 1.3 ) Pub Date : 2021-07-31 , DOI: 10.1080/10739149.2021.1956948
Rongchao Chen 1, 2 , Zhihong Li 2, 3 , Ying Shi 1 , Li-Zhi Liu 1 , Yuexiang Wang 2, 4 , Baoliang Lv 5
Affiliation  

Abstract

Wide-angle X-ray scattering (WAXS) is routinely used to characterize the ordered structure in materials. The measured angles are generally calibrated by using standard samples with several diffraction peaks. When a WAXS instrument uses a one-dimensional linear detector, which is tilted to the direct beam, the angle calibrations need three standard diffraction peaks. This contribution presents the corresponding analytical solution of the calibration equations and error estimation matrix and performs error simulation and experimental verification. The results show that the selected three standard diffraction peaks should uniformly span and widely cover the detector to reduce the error of angle calibration.



中文翻译:

用一维线性探测器对广角 X 射线散射 (WAXS) 进行角度校准和误差分析

摘要

广角 X 射线散射 (WAXS) 通常用于表征材料中的有序结构。测量的角度通常通过使用具有多个衍射峰的标准样品进行校准。当 WAXS 仪器使用与直射光束倾斜的一维线性检测器时,角度校准需要三个标准衍射峰。该贡献给出了校准方程和误差估计矩阵的相应解析解,并进行了误差模拟和实验验证。结果表明,选取的三个标准衍射峰应均匀跨越并广泛覆盖探测器,以减少角度校准的误差。

更新日期:2021-07-31
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