It is shown that information on the spatial correlation of nano-objects embedded in a crystalline matrix can be retrieved by analysing the X-ray scattering around the Bragg reflections of the host matrix. Data are reported for vertically aligned Ni and CoNi alloy nanowires (NWs) in an SrTiO₃ matrix. When the Bragg condition is fulfilled for the matrix and not for the NWs, the latter can be approximated by voids, and the scattering around the matrix reflections contains information on the self-correlation of the NWs (i.e. on their diameter d) and on the correlation between NWs (interdistance D). Nondestructive synchrotron X-ray diffraction data provide information on these values averaged over large areas, complementing local transmission electron microscopy observations. The measurements show that off-Bragg scattering around the matrix reflections can be exploited to study the spatial correlation and morphology of embedded nano-objects, independently of their crystallinity or strain or the presence of defects.

中文翻译：

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通过基质的 X 射线非布拉格散射探测嵌入的纳米线的空间相关性

结果表明，可以通过分析主体基质布拉格反射周围的 X 射线散射来检索有关嵌入晶体基质中的纳米物体的空间相关性的信息。报告了 SrTiO ₃基质中垂直排列的 Ni 和 CoNi 合金纳米线 (NW) 的数据。当矩阵满足布拉格条件而不是 NWs 时，后者可以近似为空隙，并且矩阵反射周围的散射包含有关 NWs 自相关的信息（即关于它们的直径d）和关于NW 之间的相关性（距离D）。无损同步加速器 X 射线衍射数据提供了大面积平均这些值的信息，补充了局部透射电子显微镜观察。测量表明，可以利用矩阵反射周围的非布拉格散射来研究嵌入纳米物体的空间相关性和形态，而与它们的结晶度或应变或缺陷的存在无关。