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Application of X-Ray Diffraction Methods for Refractory Raw Material Quality Control
Refractories and Industrial Ceramics ( IF 0.4 ) Pub Date : 2021-07-26 , DOI: 10.1007/s11148-021-00568-7
T. I. Ivanova 1 , V. N. Maslov 1 , S. I. Gershkovich 2 , F. R. Iksanov 2 , A. A. Kovalenko 2 , A. V. Tsunaeva 2 , S. A. Markelov 2
Affiliation  

The majority of refractory materials and raw minerals used for their production are crystalline substances. X-ray diffraction techniques can be used successfully for qualitative and quantitative determination of their mineral composition and for analysis of the technologically significant structural features that are most important in a production process. Examples are considered for the main types of refractory materials and are studied with the full-profile Rietveld refinement method in order to reveal control parameters during their production. It is concluded that structural properties of mineral phases should be taken into account that have a considerable effect on refractory material mechanical properties.



中文翻译:

X射线衍射方法在耐火原料质量控制中的应用

大多数用于生产的耐火材料和原料矿物是结晶物质。X 射线衍射技术可成功用于定性和定量测定其矿物成分,以及分析生产过程中最重要的技术上重要的结构特征。考虑了主要耐火材料类型的示例,并使用全剖面 Rietveld 细化方法进行研究,以揭示其生产过程中的控制参数。得出的结论是,应考虑矿物相的结构特性,这对耐火材料的机械性能有相当大的影响。

更新日期:2021-07-26
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