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Quantitative analysis of trace elements of silver disturbed by pulse pile up based on energy dispersive X-ray fluorescence (EDXRF) technique
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ( IF 1.4 ) Pub Date : 2021-07-22 , DOI: 10.1016/j.nima.2021.165672
Jun Hao 1, 2 , Fusheng Li 1, 2 , Qingya Wang 1, 2 , Xiaoyu Jiang 1, 2 , Benyong Yang 3 , Jie Cao 1, 2
Affiliation  

The detection of trace elements of silver in refined copper based on the portable energy dispersive X-ray fluorescence spectrometer was disturbed severely by pulse pile-up, so quantitative analysis had a high method detection limit and low accuracy. A new approach was provided to reduce the appearance of the pulse pile-up and lower the detection limit. A robust quantitative model was established. The coefficient of determination R2 of the model was lifted to 0.9927 from 0.9338; the detection limit was reduced to 0.0034 wt%. This model can be used in the metallurgical industry, power plants, and the study of micro-structure enhancement mechanisms.



中文翻译:

基于能量色散X射线荧光(EDXRF)技术的脉冲堆积扰动银微量元素定量分析

基于便携式能量色散X射线荧光光谱仪对精炼铜中微量银元素的检测受到脉冲堆积的严重干扰,因此定量分析方法检出限高,准确度低。提供了一种新方法来减少脉冲堆积的出现并降低检测限。建立了稳健的定量模型。模型的决定系数R 2从0.9338提升至0.9927;检测限降至 0.0034 wt%。该模型可用于冶金工业、发电厂以及微观结构增强机制的研究。

更新日期:2021-08-01
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