Additively manufactured scattered beam collimators are increasingly being employed to boost the sample to cell peak signal ratio in high pressure neutron diffraction studies because of manufacturing versatility and performance improvements. We study how the measured diffraction pattern is affected by the presence of a collimator downstream of the sample, and develop a novel protocol that provides more effective background rejection. This protocol takes into account critical performance-determinants that were identified in this study, namely: (i) effectively identifying the collimator pattern on the detector; (ii) understanding the dependence of this pattern on sample and cell composition; and (iii) accurately identifying and differentiating the different regions of the pattern on the detector based on the dependency of the cell or sample and finally (iv) resolving the intensities at regions of the detector where neutrons scattered from the sample are preferentially represented, in order to boost the sample to cell peak signal ratio. Application of this novel analysis protocol is shown to increase the collimator performance over the traditional method.

由于制造的多功能性和性能的改进，增材制造的散射光束准直器越来越多地用于提高高压中子衍射研究中的样品与细胞峰值信号比。我们研究如何测量衍射图案受样品下游准直器的影响，并开发一种新方案，提供更有效的背景抑制。该协议考虑了本研究中确定的关键性能决定因素，即： (i) 有效识别探测器上的准直器模式；(ii) 了解这种模式对样品和细胞组成的依赖性；(iii) 根据细胞或样品的依赖性准确识别和区分探测器上图案的不同区域，最后 (iv) 解析优先表示从样品中散射的中子的探测器区域的强度，在以提高样品与细胞的峰值信号比。