A method to measure the electrical connectivity between square superconducting plates joined by weak link interfaces is presented. It is based on observation of lines where the flow of critical current abruptly changes direction due to the presence of weak links, and the confinement created by the shape of the sample. The method is demonstrated using magneto-optical imaging (MOI) of systems consisting of up to $2\times 2$ plates joined to form a larger square. The samples used in this study are Nb films with weak links created by focused ion beam machining. Common features are found in the current flow patterns, which allow to measure the electrical connectivity between the plates by observing an angle between pairs of lines indicating where the current abruptly changes flow direction, so-called discontinuity, or d-lines.

提出了一种测量由弱连接界面连接的方形超导板之间的电连接性的方法。它基于对临界电流流动由于薄弱环节的存在而突然改变方向的线路的观察，以及由样品形状造成的限制。该方法使用系统的磁光成像 (MOI) 进行演示$2\times 2$板连接起来形成一个更大的正方形。本研究中使用的样品是通过聚焦离子束加工产生的具有弱连接的 Nb 薄膜。在电流流动模式中发现了共同特征，它允许通过观察线对之间的角度来测量板之间的电连接性，该角度指示电流突然改变流动方向的位置，即所谓的不连续性或 d 线。