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Improving the electrical properties of TiOx Schottky-type diode with an extra ZrO2 insulating layer
Modern Physics Letters B ( IF 1.8 ) Pub Date : 2021-07-16 , DOI: 10.1142/s0217984921504121
Liping Fu 1 , Xiaoqiang Song 1, 2 , Yonggang Li 1 , Zewei Wu 1, 2 , Xiaolong Fan 1 , Xiaoping Gao 3
Affiliation  

Titanium oxide has been considered a promising candidate for Schottky-type diode application. In this paper, an alternative approach for improving electrical properties of TiOx-based Schottky-type diode has been demonstrated. Compared with the Ag/TiOx/Ti structure Schottky-type diode, by embedding an extra ZrO2 insulating layer between the Ag/TiOx interface, an extremely high rectifying ratio of 109 can be obtained in the Ag/ZrO2/TiOx/Ti structure device. The improvement of the electrical properties in the Ag/ZrO2/TiOx/Ti structure device can be attributed to the localized formation of Ag metal conductive filaments in ZrO2 layer after switching on.

中文翻译:

使用额外的 ZrO2 绝缘层提高 TiOx 肖特基型二极管的电性能

氧化钛被认为是肖特基型二极管应用的有希望的候选者。在本文中,一种提高 TiO2 电性能的替代方法X基肖特基型二极管已得到证实。与 Ag/TiO 相比X/Ti 结构肖特基型二极管,通过在 Ag/TiO 之间嵌入额外的 ZrO 2绝缘层X界面,Ag/ZrO 2 /TiO可以得到10 9的极高整流比X/Ti结构装置。Ag/ZrO 2 /TiO电学性能的改善X/Ti结构器件可归因于在开启后在ZrO 2层中局部形成Ag金属导电丝。
更新日期:2021-07-16
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