(1−x)K_0.5Na_0.5NbO₃−xBi(Zn_2/3Nb_1/3)O₃ ((1−x)KNN−xBZN, x = 0.010, 0.015, 0.020, 0.025, and 0.030) lead-free ceramics were fabricated via a traditional solid-state method. The crystal structure, microstructure, dielectric, and conductivity behavior of this system were studied. Combined with X-ray diffraction (XRD) patterns, Rietveld refinement, and dielectric spectroscopy, an orthorhombic phase was determined for x = 0.010, an orthorhombic-tetragonal mixed phase was identified for x = 0.015, and a rhombohedral symmetry appears in 0.020 ⩽ x ⩽ 0.030. Both 0.98KNN−0.02BZN and 0.975KNN−0.025BZN ceramics exhibit stable permittivity and low dielectric loss tangent (tanδ) in wide temperature ranges owing to the combination of rhombohedral-tetragonal step-like feature and the diffuse phase transition from tetragonal to cubic. The activation energies of dielectric relaxation and conductivity behavior at high temperatures initially decrease slightly, then drop sharply, and finally decline slowly, which could be attributed to microstructure morphologies and the concentration of oxygen vacancies.

(1- x )K _0.5 Na _0.5 NbO ₃ - x Bi(Zn _2/3 Nb _1/3 )O ₃ ((1- x )KNN- x BZN, x = 0.010, 0.015, 0.020, 0.025, and 0.030)无铅陶瓷是通过传统的固态方法制造的。研究了该体系的晶体结构、微观结构、介电和导电行为。用X射线衍射（XRD）图案，Rietveld精修，以及介电谱相结合，被确定为斜方晶相X = 0.010，斜方晶系，正方晶的混合相被确定为X= 0.015，菱面体对称性出现在 0.020 ⩽ x ⩽ 0.030。0.98KNN-0.02BZN 和 0.975KNN-0.025BZN 陶瓷在较宽的温度范围内都表现出稳定的介电常数和低介电损耗角正切 (tan δ )，这是由于菱形-四方阶梯状特征的结合以及从四方到立方的扩散相变. 高温下介电弛豫和导电行为的活化能先略有下降，然后急剧下降，最后缓慢下降，这可能与微观结构形貌和氧空位浓度有关。