ISO Technical Report 23173 describes methods by which electron spectroscopies, including X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and synchrotron techniques, can be employed to calculate the coating thicknesses and compositions of nanoparticles. The document has been developed to review and outline the current state-of-the-art for such measurements. Such analyses of core–shell nanoparticles are common within the literature, however the methods employed are varied; the relative advantages and disadvantages of these methods, and the optimal usage of each may not be clear to the general analyst. ISO Technical Report 23173 aims to clarify the methods that are available, describe them in clear terms, exhibit examples of their use, and highlight potential issues users may face. The information provided should allow analysts of electron spectroscopy data to make clear choices regarding the appropriate analysis of electron spectroscopy data from coated nanoparticle systems and provide a basis for understanding and comparing results from different methods and systems.

中文翻译：

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ISO/TC 201 技术报告 23173 摘要—表面化学分析—电子光谱—纳米颗粒涂层的厚度和成分的测量

ISO 技术报告 23173 描述了可以使用电子光谱学，包括 X 射线光电子能谱 (XPS)、俄歇电子能谱 (AES) 和同步加速器技术来计算纳米粒子的涂层厚度和成分的方法。该文件旨在审查和概述此类测量的当前最新技术。这种核壳纳米粒子的分析在文献中很常见，但所采用的方法各不相同。这些方法的相对优势和劣势，以及每种方法的最佳用法，一般分析师可能不清楚。ISO 技术报告 23173 旨在阐明可用的方法，清楚地描述它们，展示它们的使用示例，并突出用户可能面临的潜在问题。