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X-ray Radiation Effects on SWCNT/PMMA Thin Film Nanocomposites
IEEE Transactions on Nanotechnology ( IF 2.1 ) Pub Date : 2021-05-14 , DOI: 10.1109/tnano.2021.3080624
Guddi Suman , Merlyn Pulikkathara , Richard Wilkins

This paper studies the response of a radiation sensor that was developed from single-walled carbon nanotube (SWCNT) and poly (methyl methacrylate) (PMMA) nanocomposite thin films placed on an interdigitated electrode (IDE). We studied the effects of X-rays in real-time electrical resistance of the thin film nanocomposites. A 160 kV X-ray source irradiated the nanocomposite devices with ionizing X-ray radiation at different doses and dose rates, causing the decrease in resistance of thin film through the production of charge carriers. The embedded SWCNT network helped transport radiation-induced electrons to the electrodes. Pre-irradiation resistance can be obtained rapidly from heat treatment of irradiated nanocomposite devices. It is observed that the required heat treatment time for thin film device recovery increased almost linearly with applied radiation dose. The thin film devices were operated at dc voltage as low as 0.05 V for reliable measurement of the radiation-induced change in electrical resistance. The results of this study suggest that SWCNT/PMMA thin film devices could be used for sensing X-ray radiation, with significantly higher sensitivity than comparable devices made with multi-walled CNT (MWCNT) based nanocomposites in a previous study.

中文翻译:


X 射线辐射对 SWCNT/PMMA 薄膜纳米复合材料的影响



本文研究了辐射传感器的响应,该传感器由放置在叉指电极 (IDE) 上的单壁碳纳米管 (SWCNT) 和聚甲基丙烯酸甲酯 (PMMA) 纳米复合薄膜开发而成。我们研究了 X 射线对薄膜纳米复合材料实时电阻的影响。 160 kV X射线源以不同剂量和剂量率的电离X射线辐射纳米复合材料器件,通过产生电荷载流子导致薄膜电阻降低。嵌入式单壁碳纳米管网络有助于将辐射感应电子传输到电极。通过辐照纳米复合材料器件的热处理可以快速获得预辐照抗性。据观察,薄膜器件恢复所需的热处理时间几乎随所施加的辐射剂量线性增加。薄膜器件在低至 0.05 V 的直流电压下运行,以可靠测量辐射引起的电阻变化。这项研究的结果表明,SWCNT/PMMA 薄膜器件可用于感测 X 射线辐射,其灵敏度明显高于先前研究中使用多壁碳纳米管 (MWCNT) 基纳米复合材料制成的同类器件。
更新日期:2021-05-14
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