In this paper, pixelated Frequency Selective Surface (FSS) layer embedded in two carbonyl iron-filled silicon rubber (CISR) sheets are used for design of broadband microwave absorber in frequency range of 3.95 to 8.2 GHz. Top and bottom layers of CISR sheets are prepared with 24% and 33% of Carbonyl Iron (CI) powder by volume, respectively. Reflectivity of microwave absorber, complex permittivity and complex permeability of CISR sheets are evaluated using two Rectangular Dielectric Waveguide (RDWG) measurement systems in 3.95 to 5.85 GHz frequency band (WR-187) and 5.85 to 8.2 GHz frequency band (WR-137). An algorithm was developed using Geometry-Refinement Method (GRM) and Genetic Algorithm (GA) optimization technique to design pixelated FSS layer. Measured as well as simulated reflectivity of composite microwave absorber is better than −10 dB at normal incidence in the frequency range of 3.95–8.2 GHz. For oblique incidence from 0${}^{\circ }$ to 40${}^{\circ }$, simulated reflectivity of TE and TM polarizations carried out for all angles of incidence.

在本文中，嵌入两个羰基铁填充硅橡胶 (CISR) 片中的像素化频率选择表面 (FSS) 层用于设计频率范围为 3.95 至 8.2 GHz 的宽带微波吸收器。CISR 片的顶层和底层分别用 24% 和 33% 的羰基铁 (CI) 粉末制备。使用两个矩形介质波导 (RDWG) 测量系统在 3.95 至 5.85 GHz 频段 (WR-187) 和 5.85 至 8.2 GHz 频段 (WR-137) 中评估微波吸收体的反射率、CISR 片的复介电常数和复磁导率。使用几何细化方法 (GRM) 和遗传算法 (GA) 优化技术开发了一种算法来设计像素化 FSS 层。在 3.95-8.2 GHz 频率范围内，在垂直入射时，复合微波吸收器的测量和模拟反射率优于 -10 dB。对于从 0 开始的斜入射${}^{\circ }$ 到 40${}^{\circ }$，对所有入射角进行的 TE 和 TM 偏振的模拟反射率。