Abstract

Lipstick smear analysis can provide valuable information in forensic investigations, but it is difficult to distinguish lipstick products because their complex compositions can vary with the brand and product. In this study, various lipstick samples were analyzed using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR). ATR-FTIR method was useful for preliminary categorization of lipstick. Generally, ToF-SIMS provides chemical information about sample surfaces. Each lipstick sample showed characteristic ion peaks in the ToF-SIMS spectra. To investigate the effect of the substrate on the ToF-SIMS spectra, two lipsticks were applied to five different substrates (white paper, glass slide, tissue paper, orange cotton fabric, and black cotton fabric) and analyzed using principal component analysis. Trace lipstick smears deposited on tissue paper and cigarette butts were analyzed and compared with results from reference lipstick samples. ToF-SIMS is a promising technique for discrimination and classification of lipsticks in forensic science.

中文翻译：

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使用飞行时间二次离子质谱法对口红进行法医表征

摘要

口红涂片分析可以在法医调查中提供有价值的信息，但很难区分口红产品，因为它们的复杂成分会因品牌和产品而异。在本研究中，使用飞行时间二次离子质谱 ( ToF-SIMS ) 和衰减全反射傅里叶变换红外光谱 ( ATR-FTIR )分析了各种口红样品。）。ATR-FTIR 方法可用于口红的初步分类。通常，ToF-SIMS 提供有关样品表面的化学信息。每个口红样品在 ToF-SIMS 光谱中都显示出特征离子峰。为了研究底物对 ToF-SIMS 光谱的影响，将两种口红涂在五种不同的底物（白纸、载玻片、薄纸、橙色棉织物和黑色棉织物）上，并使用主成分分析进行分析。分析沉积在薄纸和烟头上的痕量唇膏污迹，并与参考唇膏样品的结果进行比较。ToF-SIMS 是一种在法医学中区分和分类口红的有前途的技术。