Ta metal is frequently used as a raw material in the production of military hardware and electromagnetic components; therefore, obtaining high-purity tantalum is emerging as an important goal. Here, Ta metal powder was successfully prepared by reduction of Mg gas with tantalum pentoxide (Ta₂O₅). The reduction behavior was studied kinetically using Ta₂O₅ with different initial particle sizes (0.3 and 1.2 μm). Reduction temperature varied in the range from 1073 to 1273 K. In the X-ray diffraction patterns of reduced powders, pure Ta peaks appear above 1123 K when using the 0.3 μm initial powder, and at 1173 K when using the 1.2 μm initial powder. With increasing reduction temperature, reduction rates were higher with the use of the 0.3 μm powder than with the coarser 1.2 μm powder. This behavior resulted in different activation energies for Mg-reduction (5.234 and 8.695 kJ/mol for the 0.3 and 1.2 μm powder, respectively). In the powder reduced at 1273 K, the oxygen content was lowered to 0.66 and 0.88 wt% for the 1.2 and 0.3 μm powders, respectively; this is explained by differences in the specific surface area according to particle size.

钽金属经常用作生产军用硬件和电磁元件的原材料；因此，获得高纯度钽正成为一个重要目标。在这里，通过用五氧化_二钽 (Ta ₂ O ₅ )还原 Mg 气体成功地制备了 Ta 金属粉末。使用 Ta ₂ O ₅动力学研究还原行为具有不同的初始粒径（0.3 和 1.2 μm）。还原温度在 1073 到 1273 K 的范围内变化。在还原粉末的 X 射线衍射图中，使用 0.3 μm 初始粉末时纯 Ta 峰出现在 1123 K 以上，使用 1.2 μm 初始粉末时出现在 1173 K。随着还原温度的升高，使用 0.3 μm 粉末的还原率高于使用较粗的 1.2 μm 粉末的还原率。这种行为导致了不同的镁还原活化能（0.3 和 1.2 微米粉末分别为 5.234 和 8.695 kJ/mol）。在 1273 K 还原的粉末中，1.2 和 0.3 μm 粉末的氧含量分别降低到 0.66 和 0.88 wt%；这可以通过比表面积根据粒度的差异来解释。