Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specifications are met and maintained. Scalable and flexible access to these instruments is offered by reconfigurable scan networks (RSNs), e.g., IEEE Std. 1687. As RSNs themselves can become faulty, there is a need to exclude and bypass faulty parts so that remaining instruments can be used. To avoid keeping track and updating description languages for each individual IC, we propose an on-chip hardware block that makes adjustments according to the fault status of a particular IC. We show how this block enables test for faulty scan chains, localization of faulty scan chains, and repair by excluding faulty scan chains. We made implementations and experiments to evaluate the overhead in terms of transported data and area.

中文翻译：

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可重构扫描网络的优雅降级


现代集成电路 (IC) 包括数千个片上仪器，以确保满足和维持规格。可重新配置扫描网络 (RSN)（例如 IEEE 标准）提供对这些仪器的可扩展且灵活的访问。 1687. 由于 RSN 本身可能会出现故障，因此需要排除并绕过故障部件，以便可以使用剩余的仪器。为了避免跟踪和更新每个单独 IC 的描述语言，我们提出了一个片上硬件块，可以根据特定 IC 的故障状态进行调整。我们展示了该块如何实现对错误扫描链的测试、错误扫描链的定位以及通过排除错误扫描链进行修复。我们进行了实现和实验来评估传输数据和区域方面的开销。