Two-cycle gate-exhaustive faults provide a comprehensive model for delay defects that are localized to gates (cells or subcircuits). However, the number of two-cycle gate-exhaustive faults can be excessive. Cell-aware faults are obtained by performing layout analysis of cells to select faults that are important to detect. This article suggests a complementary view of faults that are important to detect. Under this view, a two-cycle gate-exhaustive fault is important to detect if it can affect the circuit during functional operation. Such faults can be identified by generating functional broadside tests. To obtain unconstrained two-cycle tests, which are more compact and detect more faults than functional broadside tests, the article uses a test generation procedure that extracts test cubes from functional broadside tests, merges the test cubes into tests, and derives both broadside and skewed-load tests from the resulting test data. The procedure is iterative to allow a gradual increase in the number of tests and the number of detected two-cycle gate-exhaustive faults. Experimental results for benchmark circuits demonstrate the tradeoff explored by the procedure.

中文翻译：

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选择两周期栅极穷举故障进行测试生成的功能约束


两周期栅极穷举故障为局限于栅极（单元或子电路）的延迟缺陷提供了综合模型。然而，两周期栅极穷举故障的数量可能过多。通过对单元进行布局分析来选择需要检测的重要故障，从而获得单元感知故障。本文提出了对检测重要的故障的补充观点。根据这种观点，两周期栅极穷举故障对于检测它是否会在功能操作期间影响电路非常重要。此类故障可以通过生成功能性全面测试来识别。为了获得比功能性宽边测试更紧凑、检测到更多故障的无约束双周期测试，本文使用了一种测试生成过程，该过程从功能性宽边测试中提取测试立方体，将测试立方体合并到测试中，并导出宽边和偏斜测试。 - 从生成的测试数据加载测试。该过程是迭代的，以允许逐渐增加测试数量和检测到的两周期栅极穷举故障的数量。基准电路的实验结果证明了该过程所探索的权衡。