Four-dimensional scanning transmission electron microscopy is demonstrated to be a powerful technique for interrogating local strain of twisted graphene bilayers, revealing a two-regime lattice reconstruction process below the ‘magic’ angle.

中文翻译：

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显微镜下的魔法

四维扫描透射电子显微镜被证明是一种强大的技术，用于询问扭曲石墨烯双层的局部应变，揭示了“魔”角以下的两态晶格重建过程。