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Birefringence compensation for single-shot 3D profilometry using a full-Stokes imaging polarimeter
Optical Review ( IF 1.2 ) Pub Date : 2021-06-28 , DOI: 10.1007/s10043-021-00675-3
Yuuki Maeda , Shuhei Shibata , Nathan Hagen , Yukitoshi Otani

We demonstrate a single-shot uniaxial 3D profilometry system that illuminates a sample with a structured polarization pattern and measures the reflected full-Stokes polarimetric image. Some non-contact 3D measurements require evaluating samples located in a protected environment. For example, this may be a sample under the lid of an acrylic Petri dish, a sample that has a protective film overlay, or products housed inside a plastic container. To deal with these cases, we adapt our measurement system to capture the complete polarization state using a single-shot full-Stokes imaging system consisting of two polarization cameras. This system cannot only measure the dynamic 3D shape at video rate, but can also compensate for any birefringent layers between the illumination arm and the sample under measurement. We present the measurement principles of the system and show the results of a real-time 3D profilometry experiment in which a sample was measured under the lid of an acrylic Petri dish.



中文翻译:

使用全斯托克斯成像偏振计进行单次 3D 轮廓测量的双折射补偿

我们展示了一种单次单轴 3D 轮廓测量系统,该系统用结构化偏振图案照亮样品并测量反射的全斯托克斯偏振图像。一些非接触式 3D 测量需要评估位于受保护环境中的样品。例如,这可能是亚克力培养皿盖子下的样品、具有保护膜覆盖层的样品,或放置在塑料容器内的产品。为了处理这些情况,我们调整我们的测量系统以使用由两个偏振相机组成的单次全斯托克斯成像系统来捕获完整的偏振状态。该系统不仅可以以视频速率测量动态 3D 形状,还可以补偿照明臂和被测样品之间的任何双折射层。

更新日期:2021-06-28
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