The X-ray fluorescence spectroscopy (XRF) has been widely applied on the analysis of elements. The traditional sample preparation needs a large sample weight and high temperature/pressure. To overcome these drawbacks, we used graphene oxide (GO) as a matrix for the carry of trace metal (copper was used as a model) and constructed a sandwich-layered GO which carried trace copper nanomembrane (SL-GO-Cu). After the optimization of filter membranes, nanomembrane composition and GO content in the bottom layer of SL-GO-Cu, the limit of detection (LOD) of SL-GO-Cu achieves 2.99 μg/g. The LOD is ca. 1/3 or 1/1923 of the traditional melt pellets of trace CuO (MPT-Cu) and tabletting pellets of trace CuO (TPT-Cu) methods, respectively. The SL-GO-Cu is independent of CuO size, but varies with different Cu compounds. Recoveries of all the SL-GO-Cu samples prepared above are higher than 94% and do not show significant difference. In summary, the SL-GO-Cu is a promising method for the efficient and economical determination of trace elements.

中文翻译：

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使用氧化石墨烯和 X 射线荧光光谱法定量检测痕量铜

X射线荧光光谱仪（XRF）已广泛应用于元素分析。传统的样品制备需要大样品量和高温/高压。为了克服这些缺点，我们使用氧化石墨烯（GO）作为载体来承载痕量金属（铜作为模型），并构建了一种夹层层GO，它承载了痕量铜纳米膜（SL-GO-Cu）。经过对SL-GO-Cu底层滤膜、纳米膜成分和GO含量的优化，SL-GO-Cu的检测限（LOD）达到2.99μ克/克。LOD 约为。分别是传统微量CuO（MPT-Cu）熔粒法和微量CuO压片法（TPT-Cu）法的1/3或1/1923。SL-GO-Cu 与 CuO 尺寸无关，但随不同的 Cu 化合物而变化。以上制备的所有 SL-GO-Cu 样品的回收率均高于 94%，并且没有显示出显着差异。总之，SL-GO-Cu 是一种有效且经济的痕量元素测定方法。