Practical systemic early failure analysis (SEFA) discovered significant safety, quality, and reliability (SQR) deficiency created by a tiny obscure transition zone (TZ) located among conventional segments (contacts, winding, and packaging). TZ inherent vulnerabilities cause confusing, persistent, and dangerous early failures (TZEFs) which traditional methods overlook and/or misinterpret. TZ is the weak link determining risks, losses, and the costs of otherwise enhanced segments, parts, and systems. SEFA performed within a closed analytical loop (CAL) characterized, prioritized, and classified TZEF modes. Improvements resolved TZEF effectively and efficiently, protected new models, and illustrated several SEFA-CAL principles versus traditional ones.

中文翻译：

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实用的早期质量——微绕电阻器过渡区的可靠性分析


实用系统早期故障分析 (SEFA) 发现，传统部分（触点、绕组和封装）之间的微小模糊过渡区 (TZ) 造成了严重的安全性、质量和可靠性 (SQR) 缺陷。 TZ 固有的漏洞会导致令人困惑、持续且危险的早期故障 (TZEF)，传统方法会忽视和/或误解这些故障。 TZ 是薄弱环节，决定着增强的细分市场、零件和系统的风险、损失和成本。 SEFA 在闭路分析环路 (CAL) 内执行，该闭路分析环路具有特征、优先级和分类的 TZEF 模式。改进有效且高效地解决了 TZEF，保护了新模型，并说明了几个 SEFA-CAL 原则与传统原则的比较。