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Experimental L-series x ray production cross sections for Re by tuning synchrotron radiation across its Li (i=1–3) sub-shell ionization thresholds
Radiation Physics and Chemistry ( IF 2.8 ) Pub Date : 2021-06-11 , DOI: 10.1016/j.radphyschem.2021.109599
Vibha Ayri , Sandeep Kaur , Anil Kumar , M. Czyzycki , A.G. Karydas , Sanjiv Puri

In the present work, the Lk (k = l, α, η, β1, β3, β6, β4, β2,15, β5,7, β9,10, γ1,5, γ2,3,6,8, γ4) x ray production (XRP) cross sections have been measured for Re at energies across its Li (i = 1–3) sub-shell ionization threshold energies covering the region 10.5 keV–14.0 keV using synchrotron radiation. The measured values have been compared with the three sets of XRP cross sections calculated using the Dirac-Fock model based x ray emission rates, the non-relativistic Hartree-Fock-Slater model based Li (i = 1–3) sub-shell photoionization cross-sections and three sets of the fluorescence (ωi) and Coster-Kronig (fij) yields based on the Dirac-Hartree-Slater model based values, the semi-empirical values and the experimental values reported earlier by us. The present measured XRP cross sections are found to be in a good agreement with those calculated using the experimental ωi/fij values; whereas these are found to be significantly lower (~30%) than those calculated using the theoretical and the semi-empirical ωi/fij values. In view of the observed good agreement of the present measured Lk XRP cross sections with those calculated using the experimental fluorescence and Coster-Kronig yields and that of the measured branching ratios (ILl/ILα,; ILβ2,15/ILα,; I/ILβ1; ILγ1,5/ILβ1 and ILγ2,3/ILβ3) with the theoretical values calculated using the Dirac-Fock model based x ray emission rates, the use of these parameters is recommended for different analytical applications.



中文翻译:

对于重新实验L-序列x射线产生截面通过在其L-调谐同步加速器辐射(I = 1-3)子壳电离的阈值

在目前的工作中,L k (k = l, α, η, β 1 , β 3 , β 6 , β 4 , β 2,15 , β 5,7 , β 9,10 , γ 1,5 , γ 2,3,6,8,γ 4)X射线产生(XRP)的横截面已被用于测量在再横跨其L-能量(I = 1-3)子壳电离阈值能量覆盖区域10.5千电子伏,14.0 keV 使用同步辐射。已将测量值与使用基于 Dirac-Fock 模型的 X 射线发射率、基于非相对论的 Hartree-Fock-Slater 模型的 L i计算的三组 XRP 横截面进行了比较。(i = 1–3) 子壳层光电离截面和三组荧光 (ω i ) 和 Coster-Kronig (f ij ) 产率基于基于 Dirac-Hartree-Slater 模型的值,半经验值以及我们之前报道的实验值。发现当前测量的 XRP 横截面与使用实验 ω i /f ij值计算的那些非常吻合;而这些被发现明显低于使用理论和半经验 ω i / f ij值计算的值(~30%)。鉴于观察到的当前测量的 L k 的良好一致性XRP与那些利用实验荧光和科斯特-克勒尼希产量计算,并且横截面测得的分支比(I的的L1 / I Lα, ;我Lβ2,15 / I Lα, ;我 / I Lβ1 ;我Lγ1,5 / I Lβ1和 I Lγ2,3 /I Lβ3 ) 以及使用基于 Dirac-Fock 模型的 X 射线发射率计算的理论值,建议将这些参数用于不同的分析应用。

更新日期:2021-06-17
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