We examined the electrical and local structural properties of a VO₂ film at different electric fields using electrical resistance and x-ray absorption fine structure (XAFS) measurements at the V K edge in the temperature range of 30–100 °C. The T_c value of the metal-to-insulator transition (MIT) during both heating and cooling decreases with electric field. When the electric field exceeds a certain value, the MIT becomes sharper due to Joule heating. The MIT, the structural phase transition (SPT), and the pre-edge peak transition of the VO₂ do not congruently occur at a uniform temperature. A metallic VO₂ is observed in only the rutile (or M2) symmetry. An electric field induces a substantial amount of conduction electrons in insulating VO₂. Simultaneously measured resistance and XAFS reveal that Joule heating caused by an external electric field significantly affects the MIT and SPT of VO₂.

我们在 30–100 °C 的温度范围内使用电阻和 X 射线吸收精细结构 (XAFS) 在 VK 边缘测量不同电场下VO ₂薄膜的电学和局部结构特性。在加热和冷却过程中，金属到绝缘体转变 (MIT)的 T _c值随着电场的增加而降低。当电场超过某个值时，由于焦耳热，MIT 变得更尖锐。MIT、结构相变 (SPT) 和 VO ₂的前边缘峰转变不会在均匀温度下一致发生。金属 VO ₂仅在金红石（或 M2）对称性中观察到。电场在绝缘的VO _{2 中}感应出大量的传导电子。同时测量的电阻和 XAFS 表明，由外部电场引起的焦耳热显着影响 VO ₂的 MIT 和 SPT 。