In article number 2100056, Mario Lanza and co-workers report that the method most widely used to measure the thickness of 2D materials, which consists of measuring a topographic map with atomic force microscopy at the edge and plotting a cross section at a random location, is inaccurate. Plotting the histogram height of the topographic map is demonstrated to be much more reliable.

中文翻译：

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二维材料的高精度厚度测定（Crystal Research and Technology 6/2021）

在文章编号 2100056 中，Mario Lanza 及其同事报告说，最广泛用于测量 2D 材料厚度的方法包括在边缘使用原子力显微镜测量地形图并在随机位置绘制横截面，是不准确的。绘制地形图的直方图高度被证明更加可靠。