Extreme ultraviolet (EUV) spectra emitted from low-Z impurity ions in the wavelength range of 10–500 were observed in Experimental Advanced Superconducting Tokamak (EAST) discharges. Several spectral lines from K- and L-shell partially ionized ions were successfully observed with sufficient spectral intensities and resolutions for helium, lithium, boron, carbon, oxygen, neon, silicon and argon using two fast-time-response EUV spectrometers of which the spectral intensities are absolutely calibrated based on the intensity comparison method between visible and EUV bremsstrahlung continua. The wavelength is carefully calibrated using well-known spectra. The lithium, boron and silicon are individually introduced for the wall coating of the EAST vacuum vessel to suppress mainly the hydrogen and oxygen influxes from the vacuum wall, while the carbon and oxygen intrinsically exist in the plasma. The helium is frequently used as the working gas as well as the deuterium. The neon and argon are also often used for the radiation cooling of edge plasma to reduce the heat flux onto the divertor plate. The measured spectra were analyzed mainly based on the database of National Institute of Standards and Technology. As a result, spectral lines of He II, Li II–III, B IV–V, C III–VI, O III–VIII, Ne II–X, Si V–XII, and Ar X–XVI are identified in EAST plasmas of which the central electron temperature and chord-averaged electron density range in T _e0=0.6–2.8 keV and n _e = (0.5–6.0) 10¹⁹ m⁻³, respectively. The wavelengths and transitions of EUV lines identified here are summarized and listed in a table for each impurity species as the database for EUV spectroscopy using fusion plasmas.

从低Z发射的极紫外 (EUV) 光谱在实验性先进超导托卡马克 (EAST) 放电中观察到 10-500 波长范围内的杂质离子。使用两个快速时间响应 EUV 光谱仪成功地观察到来自 K 和 L 壳部分电离离子的几条谱线，具有足够的光谱强度和分辨率的氦、锂、硼、碳、氧、氖、硅和氩光谱强度是基于可见光和 EUV 轫致辐射连续体之间的强度比较方法绝对校准的。波长是使用众所周知的光谱仔细校准的。EAST真空容器的壁涂层分别引入锂、硼和硅，主要抑制氢和氧从真空壁流入，而碳和氧本质上存在于等离子体中。氦气和氘气一样经常用作工作气体。氖和氩也经常用于边缘等离子体的辐射冷却，以减少到偏滤器板上的热通量。测量的光谱主要基于美国国家标准技术研究院的数据库进行分析。结果，在 EAST 等离子体中鉴定了 He II、Li II-III、B IV-V、C III-VI、O III-VIII、Ne II-X、Si V-XII 和 Ar X-XVI 的谱线其中中心电子温度和弦平均电子密度范围为T _e0 =0.6–2.8 keV 和n _e = (0.5–6.0) 10 ¹⁹ m ^-3，分别。此处确定的 EUV 谱线的波长和跃迁被汇总并列在每个杂质种类的表格中，作为使用聚变等离子体的 EUV 光谱的数据库。