Thermographic phosphors have been employed for temperature sensing in challenging environments, such as on surfaces or within solid samples exposed to dynamic heating, because of the high temporal and spatial resolution that can be achieved using this approach. Typically, UV light sources are employed to induce temperature-sensitive spectral responses from the phosphors. However, it would be beneficial to explore x-rays as an alternate excitation source to facilitate simultaneous x-ray imaging of material deformation and temperature of heated samples and to reduce UV absorption within solid samples being investigated. The phosphors BaMgAl₁₀O₁₇:Eu (BAM), Y₂SiO₅:Ce, YAG:Dy, La₂O₂S:Eu, ZnGa₂O₄:Mn, Mg₃F₂GeO₄:Mn, Gd₂O₂S:Tb, and ZnO were excited in this study using incident synchrotron x-ray radiation. These materials were chosen to include conventional thermographic phosphors as well as x-ray scintillators (with crossover between these two categories). X-ray-induced thermographic behavior was explored through the measurement of visible spectral response with varying temperature. The incident x-rays were observed to excite the same electronic energy level transitions in these phosphors as UV excitation. Similar shifts in the spectral response of BAM, Y₂SiO₅:Ce, YAG:Dy, La₂O₂S:Eu, ZnGa₂O₄:Mn, Mg₃F₂GeO₄:Mn, and Gd₂O₂S:Tb were observed when compared to their response to UV excitation found in literature. Some phosphors were observed to thermally quench in the temperature ranges tested here, while the response from others did not rise above background noise levels. This may be attributed to the increased probability of non-radiative energy release from these phosphors due to the high energy of the incident x-rays. These results indicate that x-rays can serve as a viable excitation source for phosphor thermometry.

热成像磷光体已被用于具有挑战性的环境中的温度传感，例如在暴露于动态加热的表面或固体样品内，因为使用这种方法可以实现高时间和空间分辨率。通常，采用紫外光源来诱导磷光体的温度敏感光谱响应。然而，探索 X 射线作为替代激发源以促进材料变形和加热样品的温度的同步 X 射线成像并减少正在研究的固体样品内的紫外线吸收将是有益的。荧光粉 BaMgAl ₁₀ O ₁₇ :Eu (BAM), Y ₂ SiO ₅ :Ce, YAG:Dy, La ₂ O ₂S:Eu、ZnGa ₂ O ₄ :Mn、Mg ₃ F ₂ GeO ₄ :Mn、Gd ₂ O ₂ S:Tb 和 ZnO 在本研究中使用入射同步加速器 X 射线辐射被激发。选择这些材料以包括传统的热成像磷光体和 X 射线闪烁体（这两个类别之间有交叉）。通过测量不同温度下的可见光谱响应来探索 X 射线诱导的热成像行为。观察到入射 X 射线在这些磷光体中激发与 UV 激发相同的电子能级跃迁。BAM、Y ₂ SiO ₅ :Ce、YAG:Dy、La的光谱响应发生类似变化₂ O ₂ S:Eu、ZnGa ₂ O ₄ :Mn、Mg ₃ F ₂ GeO ₄ :Mn 和 Gd ₂ O ₂ S:Tb 与文献中发现的它们对 UV 激发的响应相比被观察到。观察到一些磷光体在此处测试的温度范围内发生热猝灭，而其他磷光体的响应并未超过背景噪声水平。这可能归因于由于入射 X 射线的高能量，这些磷光体释放非辐射能量的可能性增加。这些结果表明 X 射线可以作为磷光体测温的可行激发源。