Methylammonium lead iodide (MAPbI\(_3\)) (CH\(_3\)NH\(_3\)PbI\(_3\)) is popular material for edge technology application, but it still includes many uncertainties. Particularly, molecular and electronic degradation (electronic defect distribution) and mobility–lifetime product still hold many mysteries. Stemming from the atmospheric or light-induced degradation, mobility–lifetime product changes are still unknown and haven’t been studied up to now. In this study, mobility–lifetime product change was investigated depending on degradation source such as atmospheric and light soaked. MAPbI\(_3\) films were deposited by thermal chemical vapor deposition (thermal CVD). Structural analysis was done by X-ray diffraction (XRD), respectively. Deposited MAPbI\(_3\) films were exposed to laboratory ambient, vacuum atmosphere, deionized water vapor (DIWV) atmosphere and UV light soaking at constant temperature (300K) to define changes on mobility–lifetime product.

甲基碘化铅 (MAPbI \(_3\) ) (CH \(_3\) NH \(_3\) PbI \(_3\) ) 是边缘技术应用的流行材料，但它仍然包含许多不确定性。特别是，分子和电子退化（电子缺陷分布）和迁移率-寿命产品仍然存在许多谜团。由于大气或光诱导的退化，迁移率-寿命产品的变化仍然未知，到目前为止还没有被研究过。在这项研究中，根据大气和光照等降解源，研究了迁移率 - 寿命产品的变化。MAPbI \(_3\)通过热化学气相沉积（热 CVD）沉积薄膜。分别通过 X 射线衍射 (XRD) 进行结构分析。将沉积的 MAPbI \(_3\)薄膜暴露于实验室环境、真空气氛、去离子水蒸气 (DIWV) 气氛和恒温 (300K) 下的紫外线浸泡，以定义迁移率 - 寿命产品的变化。