当前位置: X-MOL 学术Microscopy › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Phase imaging dislocations using diffracted beam interferometry
Microscopy ( IF 1.5 ) Pub Date : 2020-12-02 , DOI: 10.1093/jmicro/dfaa066
Rodney Herring 1
Affiliation  

A phase imaging method that measures the phase shift existing at a dislocation's core is described. The method uses the interference of two symmetrically diffracted beams on the optic axis by means of an electron biprism. Each diffracted beam carries half the phase of the dislocation core. When combined, the entire phase shift of the dislocation core is obtained.

中文翻译:

使用衍射光束干涉法的相位成像位错

描述了一种测量位错核心处存在的相移的相位成像方法。该方法通过电子双棱镜利用两束对称衍射光束在光轴上的干涉。每个衍射光束携带位错核心相位的一半。当组合时,获得位错核心的整个相移。
更新日期:2020-12-02
down
wechat
bug