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Wide-Field Super-Resolved Raman Imaging of Carbon Materials
ACS Photonics ( IF 6.5 ) Pub Date : 2021-06-01 , DOI: 10.1021/acsphotonics.1c00392
Mingqun Wang 1 , Chonglei Zhang 1 , Shuo Yan 1 , Ting Chen 1 , Hui Fang 1 , Xiaocong Yuan 1
Affiliation  

In recent decades, Raman spectroscopy techniques have played an important role in the research of biology, chemistry, and materials. As a label-free chemical contrast imaging method, the resolving capacity of conventional far-field spontaneous Raman imaging is limited by the diffraction to half of the wavelength. On the other hand, the time-consuming mechanical scanning process often takes minutes to hours for large-scale imaging. Here, we report a high-throughput super-resolution Raman imaging method termed structured illumination Raman microscopy (SIRM). The achievable spatial resolution of this technique was up to 80 nm, and the spectral resolution was up to 50 cm–1. For demonstration, we used this technique to characterize several typical carbon materials, such as carbon nanotubes and graphene flakes. The samples were imaged in a field of view of 32 μm × 32 μm with megapixel sampling, and the imaging time of a specific Raman band was reduced to seconds. This technique shows potential in the fast large-scale characterization of nanomaterials in situ, which may contribute to the quality evaluation in the fabrication of carbon-based devices.

中文翻译:

碳材料的宽场超分辨拉曼成像

近几十年来,拉曼光谱技术在生物学、化学和材料的研究中发挥了重要作用。作为一种无标记化学对比成像方法,常规远场自发拉曼成像的分辨能力受限于半波长的衍射。另一方面,耗时的机械扫描过程通常需要几分钟到几小时才能进行大规模成像。在这里,我们报告了一种称为结构照明拉曼显微镜 (SIRM) 的高通量超分辨率拉曼成像方法。该技术可实现的空间分辨率高达 80 nm,光谱分辨率高达 50 cm –1. 为了演示,我们使用这种技术来表征几种典型的碳材料,例如碳纳米管和石墨烯薄片。样品在 32 μm × 32 μm 的视场中以百万像素采样成像,特定拉曼波段的成像时间减少到秒。该技术显示出在原位快速大规模表征纳米材料的潜力,这可能有助于碳基器件制造中的质量评估。
更新日期:2021-06-17
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