The electrical liquid film thickness (LFT) sensor developed at ETH Zurich is applied to study wavy annular flows. The LFT sensor consists of a matrix of electrodes put flush to the surface of the wall at which the liquid film of interest is present. The conductance between transmitter and receiver electrodes is sampled and converted into a film thickness using a calibration function obtained for a flat liquid film without waves. Due to limited lateral resolution and non-linear sensor response, waves are characterized with measuring errors, which depend on the wave height, length and angle of attack. The paper presents the result of potential field simulations of waves passing over the sensor surface. The wave parameters obtained from the simulated sensor signals are compared to the input. The results are used to quantify the uncertainty of dynamic film thickness measurements. The obtained detailed information on the sensor response allows a better interpretation of experimental results.

苏黎世联邦理工学院开发的电液膜厚度 (LFT) 传感器用于研究波浪状环形流。LFT 传感器由电极矩阵组成，这些电极与存在感兴趣的液膜的壁表面齐平。发射器和接收器电极之间的电导被采样并使用针对没有波的平坦液膜获得的校准函数转换为膜厚度。由于有限的横向分辨率和非线性传感器响应，波的特征在于测量误差，这取决于波高、长度和攻角。本文介绍了通过传感器表面的电波的势场模拟结果。将从模拟传感器信号中获得的波参数与输入进行比较。结果用于量化动态薄膜厚度测量的不确定性。获得的有关传感器响应的详细信息可以更好地解释实验结果。