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Mathematical modeling of the magnetoelectric effect of the nano bi-layer L-T mode bar structure in high frequency regime
Microsystem Technologies ( IF 1.6 ) Pub Date : 2021-05-27 , DOI: 10.1007/s00542-020-05150-8
Treetep Saengow , Salinee Choowitsakunlert , Rardchawadee Silapunt

This paper describes the magnetoelectric (ME) coupling behavior of the nano bi-layer L-T (longitudinal-transverse) mode bar structure through the ME coefficient mathematical model that is developed in high frequency regime. Terfenol-D and Lead Zirconate Titanate (PZT) are used as ferromagnetic (FM) and ferroelectric (FE) layers, respectively. The ME coefficients are determined at different layer thickness ratios and products of the operating frequency (f) and structure length (l). It is found that the ME coefficient and optimal thickness ratio increases and decreases exponentially respectively, with fl. The minimum and maximum peak ME coefficients at fl values of 0.1 and 1,200 respectively, are around 1,756 and 5,617 mV/Oe\(\cdot \)cm with the optimal thickness ratio of 0.43 and 0.19, respectively. The ME coupling behavior depends largely on the magnetostrictive effect in the FM layer that is altered by the applied magnetic field and fl. The demonstration as the read sensor for the hard disk drive (HDD) with 2 Tbit/in2 areal density and 190 Oe/bit applied magnetic field shows the output voltage across the FE layer of around 0.43 mV, which is more than sufficient for the raw signal readback.



中文翻译:

高频状态下纳米双层LT模式棒结构磁电效应的数学建模

本文通过在高频区域开发的 ME 系数数学模型描述了纳米双层 LT(纵向-横向)模式棒结构的磁电 (ME) 耦合行为。Terfenol-D 和锆钛酸铅 (PZT) 分别用作铁磁 (FM) 和铁电 (FE) 层。ME 系数是在不同的层厚比以及工作频率 ( f ) 和结构长度 ( l ) 的乘积下确定的。发现ME系数和最佳厚度比分别随fl呈指数增加和减少。fl值分别为 0.1 和 1,200 时的最小和最大峰值 ME 系数约为 1,756 和 5,617 mV/Oe\(\cdot \) cm,最佳厚度比分别为 0.43 和 0.19。ME 耦合行为很大程度上取决于 FM 层中的磁致伸缩效应,该效应被施加的磁场和fl改变。作为具有 2 Tbit/in 2面密度和 190 Oe/bit 外加磁场的硬盘驱动器 (HDD) 读取传感器的演示显示,FE 层上的输出电压约为 0.43 mV,这对于原始信号回读。

更新日期:2021-05-28
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