Abstract

Methods for measuring the bistatic RCS of objects using near-field scanning and near-field to far-field transformation by mathematical modeling are analyzed. A model two-dimensional problem of diffraction by extended scatterers is considered. A cylindrical scanner is used. One important issue in this case is the possibility of scanning on a truncated surface rather than on the full scanning surface in order to reduce the cost of measurements. Under such conditions the results of the classical method become poorly predictable and an adapted method is required. Two methods based on the expansion in cylindrical waves when scanning on a truncated surface are compared: the classical one, used to measure antenna radiation patterns (the field outside the scanning area is assumed to be zero) [1] and the method proposed by Kim, which allows one to strictly take the truncation of the scanning surface by angle into account [2]. Comparison of the obtained results of both methods confirms the prospects of using the second method.

中文翻译：

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基于Slepian函数的近场扩展，基于近场扩展的扩展体RCS测量方法的适用性研究

摘要

分析了近场扫描和近场到远场转换的数学模型测量物体双基地RCS的方法。考虑了扩展散射体的二维衍射模型问题。使用圆柱形扫描仪。在这种情况下，一个重要的问题是在截短的表面而不是在整个扫描表面上进行扫描的可能性，以降低测量成本。在这种情况下，经典方法的结果变得难以预测，因此需要一种适用的方法。比较了两种在截断面扫描时基于圆柱波扩展的方法：一种经典方法，用于测量天线辐射方向图（假定扫描区域外的场为零）[1]，另一种是Kim提出的方法。 ，这使得人们可以严格考虑到截断扫描表面的角度[2]。两种方法的获得结果的比较证实了使用第二种方法的前景。