Using a solid graphite sample the relative yields of trace-element-carbide molecular anions, containing between 1 and 8 carbon atoms (MC₁₋₈⁻), from a Cs⁺ sputter ion source were surveyed for elements (M) across the periodic table. Except for gaseous and radioactive atoms, all elements are present in the graphite at some trace levels, so this investigation could readily be done using AMS by counting unambiguously a selected M^q+ ion, with charge state q ≥ 3, from a MC_n⁻ ion beam injected into the accelerator. MC_1,2⁻ are found to be the most prolific carbide negative ions for the majority of elements, but Cs is clearly exceptional as CsC_4,6,8⁻ are the dominant ones instead. These results are consistent with past observations. Based on the same MC₁₋₈⁻ survey data, the relative elemental abundances in the graphite sample were also assessed. These abundances demonstrated a means for evaluating the basic long-term ion source memory background for any rare atom searches by AMS.

使用固体石墨样品的痕量元素碳化物分子阴离子的相对产率，碳原子数（MC 1和8之间_1-8 ^- ），从CS ⁺溅射离子源进行了调查横跨周期表的元素（M） 。除了气态和放射性原子，所有的元素都存在于一些痕量水平的石墨，所以这个调查可以容易地使用AMS通过明确地计数选择的M个进行^{Q +}离子，与充电状态q≥3，从MC _ñ ^-离子光束注入加速器。MC _1,2 ^-被发现是对大多数元件的最丰富的碳化物负离子，但是Cs的显然是优异的作为CSC _4,6,8 ^-是占主导地位的。这些结果与过去的观察结果一致。基于相同的MC _1-8 ^-调查数据，所说的石墨样品中的相对元素丰度也进行了评估。这些丰度证明了可以通过AMS评估基本长期离子源存储背景以查找任何稀有原子的方法。