当前位置: X-MOL 学术IEEE Trans. Nucl. Sci. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories
IEEE Transactions on Nuclear Science ( IF 1.9 ) Pub Date : 2021-04-09 , DOI: 10.1109/tns.2021.3072298
S. Gerardin , M. Bagatin , A. Paccagnella , S. Beltrami , A. Costantino , G. Santin , A. Pesce , V. Ferlet-Cavrois , K. Voss

A heavy-ion beam monitor based on 3-D NAND flash memories was designed and tested with heavy ions at high energy and low linear energy transfer (LET). The capability of measuring fluence, angle, uniformity, and LET of impinging particles is discussed, together with the advantages over SRAM-based implementations. We propose ad hoc algorithms for the extraction of the beam parameters, based only on user-mode commands. A validation of the system using low-LET ionizing particles impinging at different angles is presented. Experimental results show very good efficiency and accuracy.

中文翻译:


基于 3D NAND 闪存的重离子束监视器



基于 3-D NAND 闪存的重离子束监测器被设计并在高能量和低线性能量转移 (LET) 下使用重离子进行测试。讨论了测量撞击粒子的注量、角度、均匀性和 LET 的能力,以及相对于基于 SRAM 的实现的优势。我们提出了仅基于用户模式命令来提取光束参数的临时算法。提出了使用以不同角度撞击的低 LET 电离粒子对系统进行的验证。实验结果表明非常好的效率和准确性。
更新日期:2021-04-09
down
wechat
bug