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Study on the addition of SiO2 nanowires to BaTiO3: Structure, morphology, electrical and dielectric properties
Journal of Physics and Chemistry of Solids ( IF 4.3 ) Pub Date : 2021-05-20 , DOI: 10.1016/j.jpcs.2021.110183
Y. Slimani , A. Selmi , E. Hannachi , M.A. Almessiere , Gaeet AlFalah , Latifa F. AlOusi , Ghulam Yasin , Munawar Iqbal

The effects of adding silicon dioxide (SiO2) nanowires on the properties of barium titanate (BaTiO3) were investigated. The structure, morphology and optical properties were examined using X-ray powder diffraction (XRD), Fourier transform-infrared spectroscopy (FTIR), scanning electron microscopy (SEM) and ultraviolet–visible diffuse reflectance spectrophotometry (DR). All of the prepared samples crystallized with a cubic BaTiO3 structure. When the SiO2 content was <2.0 wt%, no secondary phase was observed and the (BaTiO3)1–x/(SiO2)x samples exhibited a microstructure with small grains. However, Ba2TiSi2O8 was detected upon further increasing the SiO2 content. When compared to the pure BaTiO3 sample, a slight increase in the Eg value was observed for the (BaTiO3)1–x/(SiO2)x composites. The dielectric and electrical measurements were used to analyze the dielectric constant (ε′), dissipation factor (tan(δ)), conductivity (σac) and impedance (Z). The results demonstrate that the addition of SiO2 nanowires affects the properties of BaTiO3. The study highlights the importance of SiO2 nanowires in BaTiO3 for use in microwave device applications.



中文翻译:

SiO 2纳米线添加到BaTiO 3中的研究:结构,形态,电学和介电性能

研究了添加二氧化硅(SiO 2)纳米线对钛酸钡(BaTiO 3)性能的影响。使用X射线粉末衍射(XRD),傅里叶变换红外光谱(FTIR),扫描电子显微镜(SEM)和紫外可见漫反射分光光度法(DR)检查了结构,形态和光学性质。所有制备的样品均具有立方BaTiO 3结构结晶。当SiO 2含量<2.0 wt%时,未观察到第二相,并且(BaTiO 31-x /(SiO 2x样品表现出具有小晶粒的微观结构。但是,Ba 2 TiSi进一步增加SiO 2含量时,检测到2 O 8。与纯BaTiO 3样品相比,EG对(BaTiO 31-x /(SiO 2x复合材料观察到该值。介电和电测量来分析介电常数(ε' ),损耗因子(TAN(δ)),电导率(σ AC)和阻抗(Ž)。结果表明,SiO 2纳米线的加入会影响BaTiO 3的性能。该研究强调了BaTiO 3中SiO 2纳米线在微波设备应用中的重要性。

更新日期:2021-05-26
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