Silicon solar cells and modules with front contact paste containing copper-based component,Progress in Photovoltaics

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Silicon solar cells and modules with front contact paste containing copper-based component
Progress in Photovoltaics ( IF 8.0 ) Pub Date : 2021-05-17 , DOI: 10.1002/pip.3424
Katarzyna Gawlinska‐Necek ₁ , Robert P. Socha ₂ , Pawel Balawender ₂ , Maciej K. Stodolny ₃ , Bas B. Van Aken ₄ , Zbigniew Starowicz ₁ , Piotr Panek ₁

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In this article, we present the results of aging tests of silicon photovoltaic modules with a copper-containing electrode deposited in one-step screen printing method. For front metallization, a mixture of commercial silver paste with copper filler was used, where copper constituted 30% of total paste volume. The filler is based on copper particles about 1 μm of diameter covered with a protective coating layer based on nickel (CCu1) or nickel–silver (CCu2). For the first time, Si solar cells with screen-printed front electrode containing massive copper with efficiency over 20% are reported. Aging tests included 2000 h of damp heat (DH) and 400 times of thermal cycling (TC) tests. TC results are very promising and provide slight deterioration of the electrical parameters of the modules with both CCu1 and CCu2. Greater decreases were found when performed DH tests, but it is worth pointing out that mainly fill factor (FF) and η have fallen while V_oc and I_sc did not change by more than 5% for both pastes. After 2000 h of the test, FF decreased by 28% for CCu1 and 37.4% for CCu2, whereas the efficiency deteriorated by 32% and 42.6% for CCu1 and CCu2. The electroluminescence (EL) and X-ray photoelectron spectroscopy (XPS) measurements suggest that decrease in electrical parameters is a consequence of Cu corrosion caused by harmful products of the decomposed EVA laminating film.

中文翻译：

具有含铜基成分的正面接触浆料的硅太阳能电池和模块

在本文中，我们展示了采用一步丝网印刷方法沉积含铜电极的硅光伏模块的老化测试结果。对于正面金属化，使用商业银膏与铜填料的混合物，其中铜占总膏体积的 30%。填料基于直径约 1 μm 的铜颗粒，上面覆盖有基于镍 (CCu1) 或镍银 (CCu2) 的保护涂层。首次报道了丝网印刷前电极含有大量铜的硅太阳能电池，效率超过20%。老化测试包括 2000 小时的湿热 (DH) 和 400 次热循环 (TC) 测试。TC 结果非常有希望，并且使用 CCu1 和 CCu2 的模块的电气参数略有下降。η已经下降，而两种焊膏的V _oc和I _{sc 的}变化都没有超过 5%。测试 2000 小时后，CCu1 和 CCu2 的 FF 分别下降了 28% 和 37.4%，而 CCu1 和 CCu2 的效率分别下降了 32% 和 42.6%。电致发光 (EL) 和 X 射线光电子能谱 (XPS) 测量表明，电参数的降低是由分解的 EVA 层压膜的有害产物引起的铜腐蚀的结果。

更新日期：2021-05-17

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