The induced Pt magnetization in a Pt/Co/Pt thin film structure is studied. The normally nonmagnetic Pt acquires a magnetic moment due to the magnetic proximity effect at the Co-Pt interfaces. Element specific Pt structural and magnetic properties are characterized by synchrotron-based resonant x-ray reflectivity and x-ray resonant magnetic reflectivity measurements. An advanced analysis method based on Bayesian inference is used for model fitting of the x-ray data. Using this method, we retrieve the best fit values of material parameters (e.g., thickness, interfacial roughness) from the data. Analysis of x-ray reflectivity data of this specific system shows that the Pt magnetization and Co-Pt interfacial roughness is significantly different between the top and bottom Pt layers, with both values being larger in the top Pt. The successful application of this Bayesian method to study the magnetic and structural properties of a thin film system demonstrates its effectiveness for x-ray reflectivity data analysis.

研究了Pt / Co / Pt薄膜结构中的感应Pt磁化强度。由于在Co-Pt界面处的磁性邻近效应，通常非磁性的Pt会获得磁矩。元素特有的Pt结构和磁性能通过基于同步加速器的共振X射线反射率和X射线共振磁反射率测量来表征。基于贝叶斯推断的高级分析方法用于X射线数据的模型拟合。使用这种方法，我们可以从数据中检索材料参数的最佳拟合值（例如，厚度，界面粗糙度）。该特定系统的X射线反射率数据分析表明，顶部和底部Pt层之间的Pt磁化强度和Co-Pt界面粗糙度明显不同，顶部Pt中的两个值都较大。