当前位置: X-MOL 学术Appl. Math. Comput. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Backward error analysis and inverse eigenvalue problems for Hankel and Symmetric-Toeplitz structures
Applied Mathematics and Computation ( IF 3.5 ) Pub Date : 2021-05-07 , DOI: 10.1016/j.amc.2021.126288
Sk. Safique Ahmad , Prince Kanhya

This work deals with the study of structured backward error analysis of Hankel and symmetric-Toeplitz matrix pencils. These structured matrix pencils belong to the class of symmetric matrix pencils with some additional properties that a symmetric matrix pencil does not have in general. The perturbation analysis of these two structures is discussed one by one to depict the additional properties explicitly. Present work shows the entrywise structured perturbation of matrix pencils in Frobenius norm such that the specified eigenpairs become exact eigenpairs of an appropriately perturbed matrix pencil. The framework used here maintains the sparsity in the perturbation of the above-structured matrix pencils. Further, the backward error results help for solving a variety of inverse eigenvalue problems.



中文翻译:

Hankel和对称Toeplitz结构的向后误差分析和特征值反问题

这项工作涉及Hankel对称Toeplitz矩阵铅笔的结构化后向误差分析的研究。这些结构化的矩阵笔属于对称矩阵笔的一类,具有对称矩阵笔通常不具备的一些其他属性。逐一讨论了这两种结构的扰动分析,以明确描述附加属性。当前的工作显示了Frobenius范数中矩阵铅笔的入门结构化扰动,使得指定的特征成为精确的特征适当干扰的矩阵铅笔的数量。此处使用的框架在上述结构的矩阵笔的扰动中保持稀疏性。此外,后向误差结果有助于解决各种反特征值问题

更新日期:2021-05-07
down
wechat
bug