Topographic characterization of (Zr, Mn) co-doped bismuth ferrite thin film surfaces,Microscopy Research and Technique

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Topographic characterization of (Zr, Mn) co-doped bismuth ferrite thin film surfaces
Microscopy Research and Technique ( IF 2.0 ) Pub Date : 2021-05-07 , DOI: 10.1002/jemt.23783
Ştefan Ţălu ₁ , Arumugasamy Sathiya Priya ₂ , Deivasigamani Geetha ₂

Affiliation

The present work focuses on the investigations on the optical and morphological characteristics of (Zr, Mn) co-doped Bismuth ferrite thin films. Undoped Bismuth ferrite (BiFeO₃) and (Zr, Mn) co-doped Bismuth ferrite (ZMBFO) thin films were spin-coated on Pt/TiO₂/Ti/SiO₂/Si substrate. X-ray diffraction (XRD) was utilized to confirm the rhombohedral structure and the Scherrer formula was used to calculate the crystallite size of the films. The optical properties were explored using UV–visible spectroscopy and the bandgap energies were calculated using a Tauc plot. The surface morphology of the films was explored with the help of atomic force microscopy (AFM) and the three-dimensional (3-D) surface features were determined using stereometric analyses. The variation of 3-D surface parameters was identified to be the consequence of doping.

中文翻译：

(Zr, Mn) 共掺杂铋铁氧体薄膜表面的形貌表征

目前的工作重点是研究（Zr，Mn）共掺杂铋铁氧体薄膜的光学和形态特征。将未掺杂的铁氧体铋（BiFeO ₃）和（Zr，Mn）共掺杂的铁氧体铋（ZMBFO）薄膜旋涂在 Pt / TiO ₂ / Ti / SiO _{2 上}/ 如果基材。X 射线衍射 (XRD) 用于确认菱面体结构，并使用 Scherrer 公式计算薄膜的微晶尺寸。使用紫外 - 可见光谱探索光学特性，并使用 Tauc 图计算带隙能量。在原子力显微镜 (AFM) 的帮助下探索了薄膜的表面形态，并使用立体分析确定了三维 (3-D) 表面特征。3-D 表面参数的变化被确定为掺杂的结果。

更新日期：2021-05-07

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