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Characterizing microring resonators using optical frequency domain reflectometry
Optics Letters ( IF 3.1 ) Pub Date : 2021-05-06 , DOI: 10.1364/ol.425681
Xiaopei Zhang 1 , Yuexin Yin 2 , Xiaojie Yin 3, 4 , Yongqiang Wen 5 , Xiaolei Zhang 5 , Xiaoping Liu 1 , Haibin Lv 1
Affiliation  

A novel, to the best of our knowledge, method to extract optical microring resonators’ loss characteristics is proposed and demonstrated using optical frequency domain reflectometry (OFDR). Compared with the traditional optical transmission measurement method, the spatial-resolved backscattering optical signals obtained from the OFDR can clearly show the resonance mode’s increased optical path length due to its circulation inside the resonator. By further processing the backscattered optical signals, loaded $Q$-factors of several resonators can be accurately determined. A calculation model is proposed to derive the resonance mode’s intrinsic $Q$-factor from OFDR measurements of a series of loaded resonators.

中文翻译:

使用光频域反射仪表征微环谐振器

据我们所知,提出了一种新颖的方法来提取光学微环谐振器的损耗特性,并使用光频域反射法(OFDR)进行了演示。与传统的光传输测量方法相比,从OFDR获得的空间分辨后向散射光信号可以清楚地显示出共振模式由于其在谐振器内部的循环而增加了光路长度。通过进一步处理反向散射的光信号,可以精确地确定几个谐振器的负载$ Q $因数。提出了一种计算模型,用于从一系列负载谐振器的OFDR测量中得出谐振模式的固有$ Q $因子。
更新日期:2021-05-14
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