Noise improves the reliability of logic operations if noise parameter is in certain proper region (reliable region), which is known as logical stochastic resonance (LSR). LSR attracts much attention due to its potential application in new-style logic devices. However, nothing is reported about the effect of cross-correlated sine-Wiener (CCSW) bounded noises on the reliability and agility of logic operations. Here we explicitly demonstrate that in certain proper parameter regions of amplitude and correlation time of CCSW noises, CCSW noises can induce LSR. In addition, cross-correlation intensity of CCSW noises can drastically influence the range of reliable region. By comparison, moderate cross-correlation intensity can drastically destroy the reliability of the logic system, and strongly shrink the optimal parameter ranges, depending on cross-correlation time and amplitude. Moreover, for given amplitudes and cross-correlation time, a little faster logic operation can be obtained with increasing cross-correlation intensity.

如果噪声参数在某个适当的区域（可靠区域）中，则噪声会提高逻辑运算的可靠性，这称为逻辑随机共振（LSR）。LSR由于其在新型逻辑器件中的潜在应用而备受关注。但是，没有任何关于互相关正弦-维纳（CCSW）边界噪声对逻辑运算的可靠性和敏捷性的影响的报道。在这里，我们明确证明，在CCSW噪声的振幅和相关时间的某些适当参数区域中，CCSW噪声会诱发LSR。此外，CCSW噪声的互相关强度会严重影响可靠区域的范围。相比之下，适度的互相关强度会极大地破坏逻辑系统的可靠性，并会极大地缩小最佳参数范围，取决于互相关的时间和幅度。而且，对于给定的幅度和互相关时间，随着互相关强度的增加，可以获得更快的逻辑运算。