The line impedance stabilization network (LISN) is commonly used to measure the conducted electromagnetic interference (EMI) noise produced by electronic equipment. In order to improve the measurement accuracy of the conducted EMI noise, the characteristics of the LISN should be verified and calibrated, such as impedance and voltage division factor. However, the parasitic parameters of capacitance and inductance are critical to the performance of the LISN. In this paper, the high-frequency model of the LISN is proposed based on the topology and parasitic parameters. The impedance of the LISN is obtained from 150 ​kHz to 30 MHz based on scattering parameters method and vector network analyzer (VNA). The parasitic parameters of capacitance and inductance are extracted by employing the elite genetic algorithm (EGA), LISN topology and impedance. The voltage division factor and impedance of R&S LISN ENV216 is obtained and calculated by employing the proposed method, which verify the proposed method effectiveness. The work will contribute to the further design and calibration of the LISN, and improve the conducted EMI noise measurement accuracy.

线阻抗稳定网络（LISN）通常用于测量电子设备产生的传导电磁干扰（EMI）噪声。为了提高传导EMI噪声的测量精度，应验证和校准LISN的特性，例如阻抗和分压系数。但是，电容和电感的寄生参数对于LISN的性能至关重要。本文基于拓扑和寄生参数，提出了LISN的高频模型。LISN的阻抗是根据散射参数方法和矢量网络分析仪（VNA）在150 kHz至30 MHz范围内获得的。通过采用精英遗传算法（EGA），LISN拓扑和阻抗来提取电容和电感的寄生参数。利用所提方法获得并计算了R＆S LISN ENV216的分压系数和阻抗，验证了所提方法的有效性。这项工作将有助于LISN的进一步设计和校准，并提高传导EMI噪声的测量精度。