Thin films of Bi₂Te₃ alloy were grown by vacuum thermal evaporation (VTE) and pulsed laser deposition (PLD) techniques. The growth was conducted on clean substrates of non-conductive glass. X-ray diffraction (XRD) analysis was used to study the materials crystal structure. The XRD patterns revealed the crystalline nature of the prepared films. Surface morphology was investigated by the atomic force microscopy (AFM) showing that the films are formed of crystallites bounded by twin boundaries oriented in the c-axis in a way that perpendicular to the substrate plane. The samples shown to be stoichiometric and of good morphology. Transmission and reflection spectral have been obtained at room temperature using a double beam Jasco spectrophotometer. Absorption coefficient, extinction coefficient and refractive index were determined. The optical band gap was evaluated by measuring the fundamental absorption and extrapolation of the linear portion of (αhν)² versus hν plots. The plots indicated direct allowed transition. Comparison between all optical parameters of the films prepared by the two different methods has been performed.

Bi ₂ Te ₃薄膜通过真空热蒸发（VTE）和脉冲激光沉积（PLD）技术来生长合金。生长是在干净的非导电玻璃基板上进行的。X射线衍射（XRD）分析被用来研究材料的晶体结构。XRD图谱揭示了所制备膜的结晶性质。通过原子力显微镜（AFM）研究了表面形态，结果表明膜是由微晶形成的，这些微晶由在c轴上取向的孪晶边界以垂直于基底平面的方式界定。样品显示出化学计量的和良好的形态。使用双光束Jasco分光光度计在室温下获得透射光谱和反射光谱。测定吸收系数，消光系数和折射率。²对hν图。该图指示直接允许的过渡。已经对通过两种不同方法制备的薄膜的所有光学参数进行了比较。