XPS being important study for the analysis of chemical state and composition at the surface level along with the bonding between elements. XPS study was carried out for the optimized spray deposited ZnS_0.4Se_0.6 thin films, which is a prominent IIVI ternary chalcogenide optoelectronic material. Core spectra of Zn 2p, S 2p, Se 3d, and Se 3p were recorded for the analysis. As sulfur and selenium coexist in the sample, the detailed analysis of XPS is much needed. Analysis is challenging due to overlapping region of Se 3p peak and S 2p peak. Compared to previous reports, in the present sample, relatively lower charging effects were observed. The binding energies reported here could be used as reference for ZnSSe material. The composition of elements in the sample were also calculated, which agrees with the nominal composition.

XPS是用于分析表面水平的化学状态和组成以及元素之间的键合的重要研究。XPS研究对优化的ZnS _0.4 Se _0.6喷涂薄膜进行了研究，这是一个突出的II六元硫族化物光电材料。记录Zn 2p，S 2p，Se 3d和Se 3p的核心光谱用于分析。由于样品中同时存在硫和硒，因此非常需要对XPS进行详细分析。由于Se 3p峰和S 2p峰的重叠区域，分析具有挑战性。与以前的报告相比，在本样本中，观察到相对较低的充电效果。此处报道的结合能可以用作ZnSSe材料的参考。还计算了样品中元素的组成，这与标称组成一致。