The microstructures and deuterium (D) retention properties were investigated for beryllium intermetallic compounds (beryllides), such as Be₁₂Ti and Be₁₂V, compared to pure beryllium (Be), exposed to high density pure D and helium (He) mixed plasmas. TEM cross-sectional observations revealed the formation of cone structures on the Be surface exposed to the plasmas at a moderate temperature of 573 K. The crystal structure of the cones and the mass loss caused by the plasma exposure implied that the cone structures were generated by sputtering. The Ti or V surface enrichment was observed on both beryllides with no cone structures developed. TDS measurements indicated that He seeding to D plasma caused a ~ 4 times reduction of the D retention for both beryllides, while no reduction was observed for Be. As a result, the beryllide samples exposed to D + He mixture plasmas showed a lower total D retention than in Be.

研究了铍金属间化合物（铍化物）（例如Be ₁₂ Ti和Be ₁₂）的微观结构和氘（D）保留性能与纯铍（Be）相比，V暴露于高密度纯D和氦（He）混合等离子体中。TEM横截面观察表明，在573 K的中等温度下，暴露于等离子体的Be表面上形成了锥状结构。锥状晶体的结构和等离子体暴露引起的质量损失表明，锥状结构是通过以下方式产生的：溅射。两种铍都观察到Ti或V表面富集，没有形成锥状结构。TDS测量表明，向D等离子体注入He会导致两种铍的D保留量降低约4倍，而Be却没有降低。结果，暴露于D + He混合等离子体的铍样品显示出比Be中更低的总D保留率。