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Investigations of Electrical Resistivity and Thermal Conductivity Dependences on Growth Rate in the Al–Cu–Ti Eutectic Alloy
International Journal of Thermophysics ( IF 2.5 ) Pub Date : 2021-05-03 , DOI: 10.1007/s10765-021-02845-6
Necmettin Maraşlı , Ümit Bayram

Directional solidification of Al–Cu–Ti (Al–33wt%Cu–0.1wt%Ti) eutectic alloy was done with a growth rate range (V = 8.58 to 2038.65 µm⋅s−1) at a temperature gradient of 6.45 K⋅mm−1 using Bridgman-type directional solidification furnace. The measurements of thermal conductivity (K) and electrical resistivity (\(\rho\)) for the Al–Cu–Ti alloy solidified with the different values of V were made by the longitudinal heat flow method (LHFM) and DC four-point probe technique (FPPT). While the highest values of K and ρ were determined to be 236.04 W⋅K–1⋅m–1 and 5.91 × 10−8 Ωm, respectively, at 8.58 μm⋅s–1, the lowest values of K and ρ were obtained to be 199.82 W⋅K–1⋅m–1 and 12.11 × 10−8 Ωm, respectively, at 2038.65 μm⋅s–1. The K and ρ dependences on V were obtained to be \(K = 259.96\; \times \,V_{{}}^{ - 0.032}\) and \(\rho = 4.47\; \times \;{10}^{{ - {8}}} \, V_{{}}^{0.13}\) from linear regression analysis. The fusion enthalpy (∆H) and specific heat difference between solid and liquid (∆CP) for the Al–Cu–Ti were also determined to be 222.69 J⋅g–1 and 0.266 Jg–1⋅K–1, respectively, by means of differential scanning calorimetry (DSC).



中文翻译:

Al-Cu-Ti共晶合金中电阻率和热导率与生长速率的关系研究

Al-Cu-Ti(Al-33wt%Cu-0.1wt%Ti)共晶合金的定向凝固是 在6.45K⋅mm的温度梯度下进行的,其生长速率范围为(V = 8.58至2038.65 µm⋅s -1)。-1使用布里奇曼型定向凝固炉。采用纵向热流法(LHFM)和直流四点法对不同V值凝固的Al-Cu-Ti合金的热导率(K)和电阻率(\(\ rho \))进行了测量。探测技术(FPPT)。而最高值ķρ分别确定为236.04W⋅K -1 ⋅m -1和5.91×10 -8Ωm的,分别在8.58μm⋅s -1,最低值ķρ得到为199.82W⋅K -1 ⋅m -1和12.11×10 -8 Ωm的,分别在2038.65μm⋅s -1。的ķρ上依赖性V得到为\(K = 259.96 \; \倍\,V _ {{}} ^ { - 0.032} \)\(\ RHO = 4.47 \; \倍\; {10} ^ {{-{8}}} \,V _ {{}} ^ {0.13} \)来自线性回归分析。聚变焓(∆ H)和固体与液体之间的比热差(∆ C P)为所述Al-Cu-Ti系也确定为222.69J⋅g -1和0.266 JG -1 ⋅K -1分别通过差示扫描量热法(DSC)的装置。

更新日期:2021-05-03
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