Burn-in is an effective method to screen out early failures of electronic devices. Typically, this is achieved by operating the devices under accelerated stress conditions. This paper focuses on a burn-in concept where a random sample of devices is drawn out of the running production, put to burn-in, and investigated for early failures. This procedure is called burn-in study. In parallel, as long as the burn-in study is ongoing, all other produced devices are subjected to burn-in screening. In this article, new flexible sampling plans for burn-in studies are introduced. These are based on the progress of these studies and defined quality targets. Furthermore, these sampling plans enable fast burn-in time reductions and various time reduction strategies. From a statistical point of view, this requires to combine the proportion of early failures in a population with their lifetime distribution function. The new model is illustrated by case studies and simulations. It contributes to burn-in cost reductions, while controlling quality levels at the same time.

中文翻译：

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高品质产品老化的灵活时间减少方法

老化是筛选电子设备早期故障的有效方法。通常，这是通过在加速应力条件下操作设备来实现的。本文重点介绍老化概念，其中从正在运行的产品中随机抽取设备样本，进行老化，并调查早期故障。此过程称为老化研究. 同时，只要老化研究正在进行中，所有其他生产的设备都会经过老化筛选。在本文中，介绍了用于老化研究的新的灵活采样计划。这些是基于这些研究的进展和定义的质量目标。此外，这些采样计划可以快速减少老化时间和各种时间减少策略。从统计的角度来看，这需要将群体中早期故障的比例与其寿命分布函数结合起来。案例研究和模拟说明了新模型。它有助于降低老化成本，同时控制质量水平。