Network-on-chip (NoC) has emerged as a scalable on-chip communication platform and, hence, has become more popular. However, as the sole communication medium, a single point of failure raised by any permanent fault can cause the failure of the entire system. Subsequently, the NoC has become a critically exposed unit that must be protected. This article primarily presents a test-time-independent and optimally distributed test scheme named “Dugdugi” that addresses channel faults, e.g., short in an Octagon and similar NoC architectures to achieve high reliability. The proposed scheme is extended to cover other channel faults, such as stuck-at and transient faults, to give its impression of a comprehensive approach. Experimental results show that the proposed scheme incurs little hardware area and detects all modeled short faults by a few clocks with achieving fault coverage metric up to 100%. Online evaluation reveals the effect of channel-short faults on various network performance metrics. In comparison to prior methodologies, the proposed scheme improves hardware area overhead up to 71.79% and reduces test time over 94.20%. Furthermore, performance overhead, such as packet latency and energy consumption, reduces up to 40.85% and 43.87%, respectively.

中文翻译：

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Dugdugi：类似于八角形的片上通信网络的最佳故障处理方案

片上网络（NoC）已经成为一种可扩展的片上通信平台，因此变得越来越流行。但是，作为唯一的通信介质，任何永久性故障引起的单点故障都可能导致整个系统出现故障。随后，NoC已成为必须受到保护的严重暴露的单元。本文主要介绍一种名为“ Dugdugi”的独立于测试时间的最佳分布式测试方案，该方案可解决通道故障，例如，在Octagon和类似的NoC架构中短路以实现高可靠性。提议的方案扩展到涵盖其他通道故障，例如卡住故障和瞬态故障，从而给人以综合方法的印象。实验结果表明，该方案几乎不占用硬件空间，仅用几个时钟就可以检测出所有建模的短路故障，故障覆盖率达到100％。在线评估揭示了通道短路故障对各种网络性能指标的影响。与现有方法相比，该方案将硬件面积开销提高了71.79％，并将测试时间减少了94.20％以上。此外，性能开销（如数据包延迟和能耗）分别减少了多达40.5％和43.87％。